Simultaneous Requirement RFS

Where multiple patterns of features are located relative to common datum features not subject to size tolerances, or to common datum features of size specified on an RFS basis, they are considered to be a single pattern. For example, in Fig. 5-16 each pattern of features is located relative to common datum features not subject to size tolerances. Since all locating dimensions are basic and all measurements are fig. 5-16 multiple patterns of features

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